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bn:00312338n
Noun Concept
Categories: Optical metrology, Spectroscopy, Radiometry
EN
ellipsometry  ellipsometer  Spectral elipsometry
EN
Ellipsometry is an optical technique for investigating the dielectric properties of thin films. Wikipedia
Definitions
Relations
Sources
EN
Ellipsometry is an optical technique for investigating the dielectric properties of thin films. Wikipedia
optical technique for characterizing thin films Wikidata
An optical technique for the investigation of the dielectric properties of thin films especially used in semiconductor manufacture. Wiktionary
IS A
measurement
Nondestructive evaluation
Wikipedia
EN
ellipsometry
Wikidata
EN
ellipsometry
Wiktionary
EN
ellipsometry
Wikipedia Redirections
EN
ellipsometer, Spectral elipsometry

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